A modular test structure for CMOS mismatch characterization
نویسندگان
چکیده
In this work a new test structure for mismatch characterization of CMOS technologies is presented. The test structure is modular, with a reduced area and it can be inserted in the space between the dies (scribe lines) on the wafers. The test structure has been implemented in a standard 0.18-μm digital CMOS technology.
منابع مشابه
Systematic Width-and-Length Dependent CMOS Transistor Mismatch Characterization and Simulation
This paper presents a methodology for characterizing the random component of transistor mismatch in CMOS technologies. The methodology is based on the design of a special purpose chip which allows automatic characterization of arrays of NMOS and PMOS transistors of different sizes. Up to 30 different transistor sizes were implemented in the same chip, with varying transistors width W and length...
متن کاملAnalog Compact Modeling for a 20-120V HV CMOS Technology
In this paper we present a full characterization of HV CMOS transistors for a 20-120V CMOS technology including DC, AC and mismatch behavior. The model is based on a sub-circuit, which describes the geometry dependent AC and DC behavior of the device as well as the parasitic substrate currents and capacitance. The sub-circuit includes the correct description of the drain current and the parasit...
متن کاملCharacterization and Modeling of Mismatch in MOS Transistors for Precision Analog Design
This paper is concerned with the design of precision MOS anafog circuits. Section ff of the paper discusses the characterization and modeling of mismatch in MOS transistors. A characterization methodology is presented that accurately predicts the mismatch in drain current over a wide operating range using a minimumset of measured data. The physical causes of mismatch are discussed in detail for...
متن کاملAn Intelligent PV Panel Structure to Extract the Maximum Power in Mismatch Irradiance
a new intelligent photovoltaic (PV) panel structure to extract the maximum power in mismatch irradiance is proposed. In conventional structures, difference of irradiance between series panels can cause the deviation of maximum power point. In this condition tracking MPP becomes difficult and reduces efficiency. Improvements in power electronics and its effects in PV industrial technology, devel...
متن کاملA Novel Hybrid-Excited Modular Variable Reluctance Motor for Electric Vehicle Applications: Analysis, Comparison, and Implementation
A variable reluctance machine (VRM) has been proven to be an outstanding candidate for electric vehicle (EV) applications. This paper introduces a new double-stator, 12/14/12-pole three-phase hybrid-excited modular variable reluctance machine (MVRM) for EV applications. In order to demonstrate the superiorities of the proposed structure, the static torque characteristics and dynamic performance...
متن کامل